Elektrotechnik TU Wroclaw: Datensatz#123: Development of idea of surface recombination in analysis of bipolar-charge transport in metal-dielectric-metal system with thick dielectric.

Published Article /

I07/1991/P-434I07/1991/P-434

ENY-ARTICLE-2008-094

Development of idea of surface recombination in analysis of bipolar-charge transport in metal-dielectric-metal system with thick dielectric.

Swistacz, B (Wroclaw University of Technology, Poland)

1991-04-19

Abstract: In this model system there is presented t,he electric conduction with three mobilities of carriers where the surface traps exist. The free electrons and holes as well as the trapped electrons form the space charge in the dielectric. The transient state is examined for the different effects of the injection of carriers. There are determined the functions j(t) and qs(t) of current density and surface charge.

Keyword(s): electric conduction ; surface traps
Note: Bulletin of the Polish Academy of Sciences. Technical Sciences. 1991 vol. 39, No 4, pp. 665-672

Fulltext : http://zet10.ipee.pwr.wroc.pl/record/123/files/

Cited by: try citation search for ENY-ARTICLE-2008-094; I07/1991/P-434I07/1991/P-434

Record created 2008-03-21, last modified 2008-03-21

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