Format: HTML | BibTeX | DC | EndNote | NLM | MARC | MARCXML
Published Article / I07/1986/P-268 ENY-ARTICLE-2008-101

The effect of generation-recombination processes and of injection mechanism on current-voltage dependences in the metal-dielectric-metal system : I. Carrier generation

Swistacz, B (Wroclaw University of Technology, Poland)


Abstract: A dielectric model in which electrons and holes are the charge carriers was studied. The space charge is formed by free electrons and holes as well as by trapped electrons. Carrier generation with two trapping states, in steady state and at constant voltage was considered in the assumed dielectric model. The considerations refer to the flat capacitor system. The charge injection mechanisms were described by the function of current density and field intensity at the electrodes. The effect of injection mechanisms in conditions of carrier generation on current-voltage relations was investigated.

Keyword(s): space charge ; carrier injection ; carrier generation
Note: Bulletin of the Polish Academy of Sciences. Technical Sciences. 1987 vol. 35, No 5/6, pp. 319-328

Fulltext :

Cited by: try citation search for ENY-ARTICLE-2008-101; I07/1986/P-268

Rekord stworzony 2008-03-22, ostatnia modyfikacja 2008-03-22

Podobne rekordy

Osoby, które oglądały tę stronę, oglądały również:
(875)  Impact of Distributed Generation on Electrical Power Network - Khan, U N - ENY-ARTICLE-2008-142
(863)  Proceedings of the Int. Conference "7th EEEIC International Workshop on Environment and Electrical Engineering" - Schwarz, H et al - ENY-PREPRINT-2008-008
(860)  Evaluation of compensation devices of DC arc furnaces using advanced spectrum estimation methods - Bracale, A et al - ENY-ARTICLE-2008-011
(859)  Adaptacyjne sieci neuronowe w zastosowaniu do identyfikacji stanu układów elektrycznych - Kostyla, P - ENY-THESIS-2008-005
(858)  Measurement of IEC Groups and Subgroups Using Advanced Spectrum Estimation Methods - Bracale, A et al - ENY-ARTICLE-2008-117

Oceń ten dokument:
Bądź pierwszy i oceń ten dokument.

Dyskusja nad tym dokumentem:
Rozpocznij dyskusję o tym dokumencie.