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Published Article / ENY-ARTICLE-2008-129

Hydrogen Influence on Properties of Thin Film Arresters

Jaroszewski, M (Wroclaw University of Technology)

2008-04-06

Abstract: The influence of H2 atmosphere on the temperature dependence of resistivity of Zn-Bi-O thin films were characterized in this study. The I-V properties of selected samples were measured by a stabilized dc power source. The resistivity of films vary considerably depending on the concentration of hydrogen.

Keyword(s): EEEIC ; Zn-Bi-O thin film arrester ; hydrogen ; resistivity
Note: EEEIC 2008


Fulltext : http://zet10.ipee.pwr.wroc.pl/record/167/files/

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Record created 2008-04-22, last modified 2008-04-22

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