Hydrogen Influence on Properties of Thin Film Arresters
Jaroszewski, M (Wroclaw University of Technology)
Abstract: The influence of H2 atmosphere on the temperature dependence of resistivity of Zn-Bi-O thin films were characterized in this study. The I-V properties of selected samples were measured by a stabilized dc power source. The resistivity of films vary considerably depending on the concentration of hydrogen.
Keyword(s): EEEIC ; Zn-Bi-O thin film arrester ; hydrogen ; resistivity
Note: EEEIC 2008
Fulltext : http://zet10.ipee.pwr.wroc.pl/record/167/files/
Cited by: try citation search for ENY-ARTICLE-2008-129
Record created 2008-04-22, last modified 2008-04-22
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