Elektrotechnik TU Wroclaw

Elektrotechnik TU Wroclaw 15 Datensätze gefunden  1 - 10nächste  gehen zum Datensatz: Die Suche hat 0.00 Sekunden gedauert. 
1.
Relations n(p) between positive and negative charge carrier concentrations in conditions of bimolecular recombinations / Swistacz, B [I07/1987/P-296] [ENY-ARTICLE-2008-099]
A model of dielectric with positive and negative charge carrier is presented. [...]
http://zet10.ipee.pwr.wroc.pl/record/128/files/
Details vom Eintrag - Ähnliche Datensätze
2.
The effect of generation-recombination processes and of injection mechanism on current-voltage dependences in the metal-dielectric-metal system : II. Carrier recombination / Swistacz, B [I07/1986/P-269] [ENY-ARTICLE-2008-102]
A dielectric model in which electrons and holes are the charge carriers was studied. [...]
http://zet10.ipee.pwr.wroc.pl/record/131/files/
Details vom Eintrag - Ähnliche Datensätze
3.
The effect of generation-recombination processes and of injection mechanism on current-voltage dependences in the metal-dielectric-metal system : I. Carrier generation / Swistacz, B [I07/1986/P-268] [ENY-ARTICLE-2008-101]
A dielectric model in which electrons and holes are the charge carriers was studied. [...]
http://zet10.ipee.pwr.wroc.pl/record/130/files/
Details vom Eintrag - Ähnliche Datensätze
4.
Kinetic Model of Carrier Recombination in Solid Dielectric / Swistacz, B [I07/1985/P-259] [ENY-ARTICLE-2008-103]
In this paper the model of solid dielectric is presented, in which the space-charge is formed by free and trapped electrons, as well as by holes. [...]
http://zet10.ipee.pwr.wroc.pl/record/132/files/
Details vom Eintrag - Ähnliche Datensätze
5.
Electron-ion conductance in the metal-dielectric-metal system with two given boundary conditions. P. 2. Generation-recombination with two mobilities. / Swistacz, B [I07/1989/P-381] [ENY-ARTICLE-2008-098]
Transport of free positive charge carriers and of trapped negative charge carriers in a model dielectric is considered. [...]
http://zet10.ipee.pwr.wroc.pl/record/127/files/
Details vom Eintrag - Ähnliche Datensätze
6.
Electron-ion conductance in the metal-dielectric-metal system with two given boundary conditions. P. 1. Carrier generation with three mobilities. / Swistacz, B [I07/1989/P-382] [ENY-ARTICLE-2008-097]
A dielectric model is considered in which space charge is formed by free carriers of positive and negative charge and trapped negative charge carriers. [...]
http://zet10.ipee.pwr.wroc.pl/record/126/files/
Details vom Eintrag - Ähnliche Datensätze
7.
Analysis of steady state electric conduction in solid with given functions of carrier mobilities under conditions of collision recombination / Swistacz, B [I07/1991/P-428] [ENY-ARTICLE-2008-095]
This work presents an analysis of the transport of "hot carriers" of charge in the planar capacitor system. [...]
http://zet10.ipee.pwr.wroc.pl/record/124/files/
Details vom Eintrag - Ähnliche Datensätze
8.
Transient states of electric conduction in solid dielectrics including carrier recombination : 2. Ideal dielectric with deep traps. / Swistacz, B [I07/1985/P-237] [ENY-ARTICLE-2008-105]
Electric conduction in a dielectric with deep traps is analysed. [...]
http://zet10.ipee.pwr.wroc.pl/record/134/files/
Details vom Eintrag - Ähnliche Datensätze
9.
A space-charge problem including trapped positive charge. A case of solar cell / Swistacz, B [I07/1998/P-528] [ENY-ARTICLE-2008-081]
A theoretical description of an interior of a solid for space charge is continued. [...]
http://zet10.ipee.pwr.wroc.pl/record/99/files/
Details vom Eintrag - Ähnliche Datensätze
10.
Carrier generation and the switching phenomenon: further theoretical description / Swistacz, B [ENY-ARTICLE-2008-034]
In this paper the problem of the current flow between the two electrodes is further continued. [...]
http://zet10.ipee.pwr.wroc.pl/record/41/files/
Details vom Eintrag - Ähnliche Datensätze

Haben Sie nicht gefunden was Sie suchten? Versuchen Sie Ihre Suche auf anderen Servern:
recid:128 in Google Books
recid:128 in Google Scholar
recid:128 in Google Web
recid:128 in INSPEC